Enhanced Virtual Prototyping for Heterogeneous Systems

This book describes a comprehensive combination of methodologies that strongly enhance the modern Virtual Prototype (VP)-based verification flow for heterogeneous systems-on-chip (SOCs). In particular, the book combines verification and analysis aspects across various stages of the VP-based verification flow, providing a new perspective on verification by leveraging advanced techniques, like metamorphic testing, data flow testing, and information flow testing. In addition, the book puts a strong emphasis on advanced coverage-driven methodologies to verify the functional behavior of the SOC as well as ensure its security. Provides an extensive introduction to the modern VP-based verification flow for heterogeneous SOCs; Introduces a novel metamorphic testing technique for heterogeneous SOCs which does not require reference models; Includes automated advanced data flow coverage-driven methodologies tailored for SystemC/AMS-based VPs; Describes enhanced functional coverage-driven methodologies to verify various functional behaviors of RF amplifiers. This book describes a comprehensive combination of methodologies that strongly enhance the modern Virtual Prototype (VP)-based verification flow for heterogeneous systems-on-chip (SOCs). In particular, the book combines verification and analysis aspects across various stages of the VP-based verification flow, providing a new perspective on verification by leveraging advanced techniques, like metamorphic testing, data flow testing, and information flow testing. In addition, the book puts a strong emphasis on advanced coverage-driven methodologies to verify the functional behavior of the SOC as well as ensure its security. Provides an extensive introduction to the modern VP-based verification flow for heterogeneous SOCs; Introduces a novel metamorphic testing technique for heterogeneous SOCs which does not require reference models; Includes automated advanced data flow coverage-driven methodologies tailored for SystemC/AMS-based VPs; Describes enhanced functional coverage-driven methodologies to verify various functional behaviors of RF amplifiers.