Mixed Signal Generic Testing in Photonic Integration

This book describes testing methods for Novel Photonic Integrated Circuits, which have become one of the hottest topics in the context of information technology. The increasing demand for this kind of device drives the need for fast and effective testing methods, as described in this book. This book describes testing methods for Novel Photonic Integrated Circuits, which have become one of the hottest topics in the context of information technology. Readers will learn that these objects are used not only to enhance the throughput of optical communications (backbone of the internet network), but also to for smart-sensing, metrology, quantum application and artificial intelligence. The increasing demand for this kind of device drives the need for fast and effective testing methods, as described in this book. In addition, this book: Includes a unique set of algorithms to test photonic circuits efficiently Presents methods in a holistic context, including aspects related to testing “ancillary” building blocks Provides insight into testing of newest photonic integrated circuits being implemented on silicon